Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura. Current Testable Design of Resistor String DACs. In Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia. pages 197-200, IEEE Computer Society, 2006. [doi]
Abstract is missing.