Masaki Hashizume, Takeomi Tamesada, Kazuhiro Yamada, Masaaki Kawakami. Fault Detection of Combinational Circuits Based on Supply Current. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 374-380, IEEE Computer Society, 1988.
@inproceedings{HashizumeTYK88, title = {Fault Detection of Combinational Circuits Based on Supply Current}, author = {Masaki Hashizume and Takeomi Tamesada and Kazuhiro Yamada and Masaaki Kawakami}, year = {1988}, tags = {rule-based}, researchr = {https://researchr.org/publication/HashizumeTYK88}, cites = {0}, citedby = {0}, pages = {374-380}, booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988}, publisher = {IEEE Computer Society}, }