Fault Detection of Combinational Circuits Based on Supply Current

Masaki Hashizume, Takeomi Tamesada, Kazuhiro Yamada, Masaaki Kawakami. Fault Detection of Combinational Circuits Based on Supply Current. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 374-380, IEEE Computer Society, 1988.

@inproceedings{HashizumeTYK88,
  title = {Fault Detection of Combinational Circuits Based on Supply Current},
  author = {Masaki Hashizume and Takeomi Tamesada and Kazuhiro Yamada and Masaaki Kawakami},
  year = {1988},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/HashizumeTYK88},
  cites = {0},
  citedby = {0},
  pages = {374-380},
  booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988},
  publisher = {IEEE Computer Society},
}