Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Masashi Takeda. Testability Analysis of IDDQ Testing with Large Threshold Value. In 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. pages 367-375, IEEE Computer Society, 2000. [doi]
@inproceedings{HashizumeYTT00, title = {Testability Analysis of IDDQ Testing with Large Threshold Value}, author = {Masaki Hashizume and Hiroyuki Yotsuyanagi and Takeomi Tamesada and Masashi Takeda}, year = {2000}, url = {http://computer.org/proceedings/dft/0719/07190367abs.htm}, tags = {testing, analysis}, researchr = {https://researchr.org/publication/HashizumeYTT00}, cites = {0}, citedby = {0}, pages = {367-375}, booktitle = {15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings}, publisher = {IEEE Computer Society}, isbn = {0-7695-0719-0}, }