Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Masashi Takeda. Testability Analysis of IDDQ Testing with Large Threshold Value. In 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. pages 367-375, IEEE Computer Society, 2000. [doi]
Abstract is missing.