Vahidin Hasic, Corinna Kofler, Senka Krivic. Towards Explaining SEM Defect Image Classification. In Inês Lynce, nello Murano, Mauro Vallati, Serena Villata, Federico Chesani, Michela Milano, Andrea Omicini, Mehdi Dastani, editors, ECAI 2025 - 28th European Conference on Artificial Intelligence, 25-30 October 2025, Bologna, Italy - Including 14th Conference on Prestigious Applications of Intelligent Systems (PAIS 2025). Volume 413 of Frontiers in Artificial Intelligence and Applications, pages 5463-5470, IOS Press, 2025. [doi]
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