Post fabrication tuning of GaN based RF power amplifiers for pico-cell applications

Muhammad Ruhul Hasin, Jennifer Kitchen. Post fabrication tuning of GaN based RF power amplifiers for pico-cell applications. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-4, IEEE Computer Society, 2016. [doi]

@inproceedings{HasinK16,
  title = {Post fabrication tuning of GaN based RF power amplifiers for pico-cell applications},
  author = {Muhammad Ruhul Hasin and Jennifer Kitchen},
  year = {2016},
  doi = {10.1109/VTS.2016.7477275},
  url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2016.7477275},
  researchr = {https://researchr.org/publication/HasinK16},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4673-8454-4},
}