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Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport

Paul E. Hasler, Andreas G. Andreou, Chris Diorio, Bradley A. Minch, Carver A. Mead. Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport. VLSI Design, 1998(1):454-461, 1998. [doi]

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