Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport

Paul E. Hasler, Andreas G. Andreou, Chris Diorio, Bradley A. Minch, Carver A. Mead. Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport. VLSI Design, 1998(1):454-461, 1998. [doi]

Abstract

Abstract is missing.