Using Colour to Model Outliers

David Hasler, Sabine Süsstrunk. Using Colour to Model Outliers. In The Eleventh Color Imaging Conference: Color Science and Engineering Systems, Technologies, Applications, CIC 2003, November 3, 2003, Scottsdale, Arizona, USA. pages 107-114, IS&T - The Society for Imaging Science and Technology, 2003. [doi]

Authors

David Hasler

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Sabine Süsstrunk

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