Michael Hassoun, Adar Kalir. Towards a new simulation testbed for semiconductor manufacturing. In 2017 Winter Simulation Conference, WSC 2017, Las Vegas, NV, USA, December 3-6, 2017. pages 3612-3623, IEEE, 2017. [doi]
@inproceedings{HassounK17, title = {Towards a new simulation testbed for semiconductor manufacturing}, author = {Michael Hassoun and Adar Kalir}, year = {2017}, doi = {10.1109/WSC.2017.8248074}, url = {https://doi.org/10.1109/WSC.2017.8248074}, researchr = {https://researchr.org/publication/HassounK17}, cites = {0}, citedby = {0}, pages = {3612-3623}, booktitle = {2017 Winter Simulation Conference, WSC 2017, Las Vegas, NV, USA, December 3-6, 2017}, publisher = {IEEE}, isbn = {978-1-5386-3428-8}, }