N. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva. Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors. Microelectronics Reliability, 43(1):57-60, 2003. [doi]
@article{HastasDBKGK03,
title = {Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors},
author = {N. A. Hastas and C. A. Dimitriadis and J. Brini and G. Kamarinos and V. K. Gueorguiev and S. Kaschieva},
year = {2003},
doi = {10.1016/S0026-2714(02)00119-1},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00119-1},
tags = {C++},
researchr = {https://researchr.org/publication/HastasDBKGK03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {1},
pages = {57-60},
}