C. A. Dimitriadis - researchr alias

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Viewing Publication 1 - 15 from 15

2016

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETsR. Lavieville, T. A. Karatsori, Christoforos Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo. essderc 2016: 142-145 [doi]

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulatorsI. Messaris, T. A. Karatsori, Nikolaos Fasarakis, Christoforos Theodorou, Spiros Nikolaidis, G. Ghibaudo, C. A. Dimitriadis. mr, 56:10-16, 2016. [doi]

2014

Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETsEleftherios G. Ioannidis, Sébastien Haendler, Christoforos Theodorou, Nicolas Planes, C. A. Dimitriadis, Gérard Ghibaudo. essderc 2014: 214-217 [doi]

Variability of nanoscale triple gate FinFETs: Prediction and analysis methodDimitrios H. Tassis, I. Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis. icecsys 2014: 710-713 [doi]

2012

Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETsNikolaos Fasarakis, Andreas Tsormpatzoglou, Dimitrios H. Tassis, Konstantinos Papathanasiou, C. A. Dimitriadis, G. Ghibaudo. icecsys 2012: 953-956 [doi]

2011

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistorsN. A. Hastas, N. Arpatzanis, C. A. Dimitriadis, Julien Brochet, Francois Templier, G. Kamarinos. mr, 51(3):556-559, 2011. [doi]

2008

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stressN. Arpatzanis, A. T. Hatzopoulos, D. H. Tassis, C. A. Dimitriadis, F. Templier, M. Oudwan, G. Kamarinos. mr, 48(4):531-536, 2008. [doi]

2006

Effects of hot carriers in offset gated polysilicon thin-film transistorsA. T. Hatzopoulos, D. H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos. mr, 46(2-4):311-316, 2006. [doi]

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold regionN. P. Papadopoulos, A. A. Hatzopoulos, D. K. Papakostas, C. A. Dimitriadis, Stilianos Siskos. iscas 2006: [doi]

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold regionN. P. Papadopoulos, A. A. Hatzopoulos, D. K. Papakostas, C. A. Dimitriadis, Stilianos Siskos. mj, 37(11):1313-1320, 2006. [doi]

A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTsIlias Pappas, L. Nalpantidis, Vasilios Kalenteridis, Stilianos Siskos, A. A. Hatzopoulos, C. A. Dimitriadis. iscas 2006: [doi]

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistorsD. H. Tassis, A. T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos. mr, 46(12):2032-2037, 2006. [doi]

2005

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistorsN. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, A. Thanailakis. mr, 45(2):341-348, 2005. [doi]

2003

Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistorsN. A. Hastas, C. A. Dimitriadis, F. V. Farmakis, G. Kamarinos. mr, 43(4):671-674, 2003. [doi]

Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistorsN. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva. mr, 43(1):57-60, 2003. [doi]

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