Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators

I. Messaris, T. A. Karatsori, Nikolaos Fasarakis, Christoforos Theodorou, Spiros Nikolaidis, G. Ghibaudo, C. A. Dimitriadis. Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. Microelectronics Reliability, 56:10-16, 2016. [doi]

Abstract

Abstract is missing.