Effects of hot carriers in offset gated polysilicon thin-film transistors

A. T. Hatzopoulos, D. H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos. Effects of hot carriers in offset gated polysilicon thin-film transistors. Microelectronics Reliability, 46(2-4):311-316, 2006. [doi]

Abstract

Abstract is missing.