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Effects of hot carriers in offset gated polysilicon thin-film transistors

A. T. Hatzopoulos, D. H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos. Effects of hot carriers in offset gated polysilicon thin-film transistors. Microelectronics Reliability, 46(2-4):311-316, 2006. [doi]

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A. T. Hatzopoulos

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D. H. Tassis

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N. Arpatzanis

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C. A. Dimitriadis

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G. Kamarinos

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