A. T. Hatzopoulos, D. H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos. Effects of hot carriers in offset gated polysilicon thin-film transistors. Microelectronics Reliability, 46(2-4):311-316, 2006. [doi]
@article{HatzopoulosTADK06,
title = {Effects of hot carriers in offset gated polysilicon thin-film transistors},
author = {A. T. Hatzopoulos and D. H. Tassis and N. Arpatzanis and C. A. Dimitriadis and G. Kamarinos},
year = {2006},
doi = {10.1016/j.microrel.2005.07.004},
url = {http://dx.doi.org/10.1016/j.microrel.2005.07.004},
tags = {C++},
researchr = {https://researchr.org/publication/HatzopoulosTADK06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {2-4},
pages = {311-316},
}