Dimitrios H. Tassis, I. Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis. Variability of nanoscale triple gate FinFETs: Prediction and analysis method. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 710-713, IEEE, 2014. [doi]
Abstract is missing.