Dimitrios H. Tassis, I. Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis. Variability of nanoscale triple gate FinFETs: Prediction and analysis method. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 710-713, IEEE, 2014. [doi]
@inproceedings{TassisMFTND14,
title = {Variability of nanoscale triple gate FinFETs: Prediction and analysis method},
author = {Dimitrios H. Tassis and I. Messaris and Nikolaos Fasarakis and Andreas Tsormpatzoglou and Spiros Nikolaidis and C. A. Dimitriadis},
year = {2014},
doi = {10.1109/ICECS.2014.7050084},
url = {http://dx.doi.org/10.1109/ICECS.2014.7050084},
researchr = {https://researchr.org/publication/TassisMFTND14},
cites = {0},
citedby = {0},
pages = {710-713},
booktitle = {21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4242-8},
}