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Variability of nanoscale triple gate FinFETs: Prediction and analysis method

Dimitrios H. Tassis, I. Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis. Variability of nanoscale triple gate FinFETs: Prediction and analysis method. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 710-713, IEEE, 2014. [doi]

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Dimitrios H. Tassis

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I. Messaris

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Nikolaos Fasarakis

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Andreas Tsormpatzoglou

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Spiros Nikolaidis

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C. A. Dimitriadis

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