N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, A. Thanailakis. Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors. Microelectronics Reliability, 45(2):341-348, 2005. [doi]
Abstract is missing.