N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, A. Thanailakis. Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors. Microelectronics Reliability, 45(2):341-348, 2005. [doi]
@article{HastasADKNGT05,
title = {Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors},
author = {N. A. Hastas and N. Archontas and C. A. Dimitriadis and G. Kamarinos and T. Nikolaidis and N. Georgoulas and A. Thanailakis},
year = {2005},
doi = {10.1016/j.microrel.2004.06.004},
url = {http://dx.doi.org/10.1016/j.microrel.2004.06.004},
tags = {C++},
researchr = {https://researchr.org/publication/HastasADKNGT05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {2},
pages = {341-348},
}