Data-driven and Event-driven Integration Architecture for Plant-wide Industrial Process Monitoring and Control

David Hästbacka, Petri Kannisto, Matti Vilkko. Data-driven and Event-driven Integration Architecture for Plant-wide Industrial Process Monitoring and Control. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 2979-2985, IEEE, 2018. [doi]

Abstract

Abstract is missing.