A CMOS SRAM Test Cell Design Using Selectively Metal-Covered Transistors for a Laser Irradiation Failure Analysis

Hiroshi Hatano. A CMOS SRAM Test Cell Design Using Selectively Metal-Covered Transistors for a Laser Irradiation Failure Analysis. IEICE Transactions, 95-C(11):1827-1829, 2012. [doi]

Abstract

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