Kazumi Hatayama, Kazunori Hikone, T. Miyazaki, H. Yamada. A practical approach to instruction-based test generation for functional modules of VLSI processors. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 17-23, IEEE Computer Society, 1997. [doi]
Abstract is missing.