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Depth from physics: physics-based image analysis and feature definition

David Hattery, Murray H. Loew. Depth from physics: physics-based image analysis and feature definition. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 711-713, IEEE, 1998. [doi]

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David Hattery

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Murray H. Loew

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