David Hattery, Murray H. Loew. Depth from physics: physics-based image analysis and feature definition. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 711-713, IEEE, 1998. [doi]
@inproceedings{HatteryL98,
title = {Depth from physics: physics-based image analysis and feature definition},
author = {David Hattery and Murray H. Loew},
year = {1998},
doi = {10.1109/ICPR.1998.711243},
url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1998.711243},
researchr = {https://researchr.org/publication/HatteryL98},
cites = {0},
citedby = {0},
pages = {711-713},
booktitle = {Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998},
editor = {Anil K. Jain and Svetha Venkatesh and Brian C. Lovell},
publisher = {IEEE},
isbn = {0-8186-8512-3},
}