Depth from physics: develpoment of a robust classifier for 2D image analysis - researchr publication authors

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David W. Hattery, Murray H. Loew, Carl E. Wick. Depth from physics: develpoment of a robust classifier for 2D image analysis. In Kenneth M. Hanson, editor, Medical Imaging 1998: Image Processing, San Diego, CA, United States, 21-26 February 1998. Volume 3338 of SPIE Proceedings, SPIE, 1998. [doi]

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