David W. Hattery, Murray H. Loew, Carl E. Wick. Depth from physics: develpoment of a robust classifier for 2D image analysis. In Kenneth M. Hanson, editor, Medical Imaging 1998: Image Processing, San Diego, CA, United States, 21-26 February 1998. Volume 3338 of SPIE Proceedings, SPIE, 1998. [doi]
@inproceedings{HatteryLW98, title = {Depth from physics: develpoment of a robust classifier for 2D image analysis}, author = {David W. Hattery and Murray H. Loew and Carl E. Wick}, year = {1998}, doi = {10.1117/12.310956}, url = {https://doi.org/10.1117/12.310956}, researchr = {https://researchr.org/publication/HatteryLW98}, cites = {0}, citedby = {0}, booktitle = {Medical Imaging 1998: Image Processing, San Diego, CA, United States, 21-26 February 1998}, editor = {Kenneth M. Hanson}, volume = {3338}, series = {SPIE Proceedings}, publisher = {SPIE}, isbn = {9780819427830}, }