Face pattern recognition under complex background

Tetsuo Hattori, Seiu Shu, Toshinori Yamasaki, Waka Fukuda. Face pattern recognition under complex background. In Proceedings of the IEEE International Conference on Systems, Man & Cybernetics: "Cybernetics Evolving to Systems, Humans, Organizations, and their Complex Interactions", Sheraton Music City Hotel, Nashville, Tennessee, USA, 8-11 October 2000. pages 3890-3894, IEEE, 2000. [doi]

Abstract

Abstract is missing.