Sewer-ML: A Multi-Label Sewer Defect Classification Dataset and Benchmark - researchr publication authors

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Joakim Bruslund Haurum, Thomas B. Moeslund. Sewer-ML: A Multi-Label Sewer Defect Classification Dataset and Benchmark. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2021, virtual, June 19-25, 2021. pages 13456-13467, Computer Vision Foundation / IEEE, 2021. [doi]

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