Joakim Bruslund Haurum, Thomas B. Moeslund. Sewer-ML: A Multi-Label Sewer Defect Classification Dataset and Benchmark. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2021, virtual, June 19-25, 2021. pages 13456-13467, Computer Vision Foundation / IEEE, 2021. [doi]
@inproceedings{HaurumM21,
title = {Sewer-ML: A Multi-Label Sewer Defect Classification Dataset and Benchmark},
author = {Joakim Bruslund Haurum and Thomas B. Moeslund},
year = {2021},
url = {https://openaccess.thecvf.com/content/CVPR2021/html/Haurum_Sewer-ML_A_Multi-Label_Sewer_Defect_Classification_Dataset_and_Benchmark_CVPR_2021_paper.html},
researchr = {https://researchr.org/publication/HaurumM21},
cites = {0},
citedby = {0},
pages = {13456-13467},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2021, virtual, June 19-25, 2021},
publisher = {Computer Vision Foundation / IEEE},
}