Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takeshi Sugawara, Yoshiki Kayano, Takafumi Aoki, Shigeki Minegishi, Akashi Satoh, Hideaki Sone, Hiroshi Inoue. Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current. IEICE Transactions, 95-C(6):1089-1097, 2012. [doi]
Abstract is missing.