T. Hayashi, M. Okui, Y. Yonehara, T. Nakamura. Deformation Measurement of Dielectric Elastomer using Slide Ring Material on a 2-D Plane. In IEEE/SICE International Symposium on System Integration, SII 2019, Paris, France, January 14-16, 2019. pages 712-717, IEEE, 2019. [doi]
@inproceedings{HayashiOYN19,
title = {Deformation Measurement of Dielectric Elastomer using Slide Ring Material on a 2-D Plane},
author = {T. Hayashi and M. Okui and Y. Yonehara and T. Nakamura},
year = {2019},
doi = {10.1109/SII.2019.8700353},
url = {https://doi.org/10.1109/SII.2019.8700353},
researchr = {https://researchr.org/publication/HayashiOYN19},
cites = {0},
citedby = {0},
pages = {712-717},
booktitle = {IEEE/SICE International Symposium on System Integration, SII 2019, Paris, France, January 14-16, 2019},
publisher = {IEEE},
isbn = {978-1-5386-3615-2},
}