John P. Hayes. Faults and Tests in Quantum Circuits. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. IEEE Computer Society, 2005. [doi]
@inproceedings{Hayes05:0, title = {Faults and Tests in Quantum Circuits}, author = {John P. Hayes}, year = {2005}, doi = {10.1109/ATS.2005.59}, url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.59}, tags = {testing}, researchr = {https://researchr.org/publication/Hayes05%3A0}, cites = {0}, citedby = {0}, booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-2481-8}, }