Jane Huffman Hayes, Giulio Antoniol, Bram Adams, Yann-Gaël Guéhéneuc. Inherent characteristics of traceability artifacts less is more. In Didar Zowghi, Vincenzo Gervasi, Daniel Amyot, editors, 23rd IEEE International Requirements Engineering Conference, RE 2015, Ottawa, ON, Canada, August 24-28, 2015. pages 196-201, IEEE Computer Society, 2015. [doi]
Abstract is missing.