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Tyler L. Hayes, Ronald Kemker, Nathan D. Cahill, Christopher Kanan. New Metrics and Experimental Paradigms for Continual Learning. In 2018 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2018, Salt Lake City, UT, USA, June 18-22, 2018. pages 2031-2034, IEEE Computer Society, 2018. [doi]

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