New Metrics and Experimental Paradigms for Continual Learning

Tyler L. Hayes, Ronald Kemker, Nathan D. Cahill, Christopher Kanan. New Metrics and Experimental Paradigms for Continual Learning. In 2018 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2018, Salt Lake City, UT, USA, June 18-22, 2018. pages 2031-2034, IEEE Computer Society, 2018. [doi]

@inproceedings{HayesKCK18,
  title = {New Metrics and Experimental Paradigms for Continual Learning},
  author = {Tyler L. Hayes and Ronald Kemker and Nathan D. Cahill and Christopher Kanan},
  year = {2018},
  url = {http://openaccess.thecvf.com/content_cvpr_2018_workshops/w40/html/Hayes_New_Metrics_and_CVPR_2018_paper.html},
  researchr = {https://researchr.org/publication/HayesKCK18},
  cites = {0},
  citedby = {0},
  pages = {2031-2034},
  booktitle = {2018 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2018, Salt Lake City, UT, USA, June 18-22, 2018},
  publisher = {IEEE Computer Society},
}