Chen He. Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{He19-22,
title = {Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers},
author = {Chen He},
year = {2019},
doi = {10.1109/ITC44170.2019.9000147},
url = {https://doi.org/10.1109/ITC44170.2019.9000147},
researchr = {https://researchr.org/publication/He19-22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4823-6},
}