Exploiting the Trust Between Boundaries: Discovering Memory Corruptions in Printers via Driver-Assisted Testing

Xiaoyu He, Erick Bauman, Feng Li, Lei Yu, Linyu Li, Bingchang Liu, Aihua Piao, Kevin W. Hamlen, Wei Huo, Wei Zou. Exploiting the Trust Between Boundaries: Discovering Memory Corruptions in Printers via Driver-Assisted Testing. In Jingling Xue, Changhee Jung, editors, Proceedings of the 21st ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2020, London, UK, June 16, 2020. pages 74-84, ACM, 2020. [doi]

@inproceedings{HeBLYLLPHHZ20,
  title = {Exploiting the Trust Between Boundaries: Discovering Memory Corruptions in Printers via Driver-Assisted Testing},
  author = {Xiaoyu He and Erick Bauman and Feng Li and Lei Yu and Linyu Li and Bingchang Liu and Aihua Piao and Kevin W. Hamlen and Wei Huo and Wei Zou},
  year = {2020},
  doi = {10.1145/3372799.3394363},
  url = {https://doi.org/10.1145/3372799.3394363},
  researchr = {https://researchr.org/publication/HeBLYLLPHHZ20},
  cites = {0},
  citedby = {0},
  pages = {74-84},
  booktitle = {Proceedings of the 21st ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2020, London, UK, June 16, 2020},
  editor = {Jingling Xue and Changhee Jung},
  publisher = {ACM},
  isbn = {978-1-4503-7094-3},
}