Xiaoyu He, Erick Bauman, Feng Li, Lei Yu, Linyu Li, Bingchang Liu, Aihua Piao, Kevin W. Hamlen, Wei Huo, Wei Zou. Exploiting the Trust Between Boundaries: Discovering Memory Corruptions in Printers via Driver-Assisted Testing. In Jingling Xue, Changhee Jung, editors, Proceedings of the 21st ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2020, London, UK, June 16, 2020. pages 74-84, ACM, 2020. [doi]
Abstract is missing.