Yibai He, Shuming Chen. Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology. Science in China Series F: Information Sciences, 57(10):1-7, 2014. [doi]
@article{HeC14-2,
title = {Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology},
author = {Yibai He and Shuming Chen},
year = {2014},
doi = {10.1007/s11432-014-5100-1},
url = {http://dx.doi.org/10.1007/s11432-014-5100-1},
researchr = {https://researchr.org/publication/HeC14-2},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {57},
number = {10},
pages = {1-7},
}