Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology

Yibai He, Shuming Chen. Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology. Science in China Series F: Information Sciences, 57(10):1-7, 2014. [doi]

Abstract

Abstract is missing.