Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC

Junjie He, Xiuhua Cao, Kiyoshi Takamasu, Meiyun Chen. Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC. IEEE T. Instrumentation and Measurement, 73:1-8, 2024. [doi]

Authors

Junjie He

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Xiuhua Cao

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Kiyoshi Takamasu

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Meiyun Chen

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