Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC

Junjie He, Xiuhua Cao, Kiyoshi Takamasu, Meiyun Chen. Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC. IEEE T. Instrumentation and Measurement, 73:1-8, 2024. [doi]

Abstract

Abstract is missing.