An evaluation method of battery DC resistance consistency caused by temperature variation

Zhichao He, Dongxu Guo, Xu Liu, Geng Yang. An evaluation method of battery DC resistance consistency caused by temperature variation. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 7623-7628, IEEE, 2017. [doi]

Authors

Zhichao He

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Dongxu Guo

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Xu Liu

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Geng Yang

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