Zhichao He, Dongxu Guo, Xu Liu, Geng Yang. An evaluation method of battery DC resistance consistency caused by temperature variation. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 7623-7628, IEEE, 2017. [doi]
@inproceedings{HeGLY17, title = {An evaluation method of battery DC resistance consistency caused by temperature variation}, author = {Zhichao He and Dongxu Guo and Xu Liu and Geng Yang}, year = {2017}, doi = {10.1109/IECON.2017.8217336}, url = {https://doi.org/10.1109/IECON.2017.8217336}, researchr = {https://researchr.org/publication/HeGLY17}, cites = {0}, citedby = {0}, pages = {7623-7628}, booktitle = {IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017}, publisher = {IEEE}, isbn = {978-1-5386-1127-2}, }