A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using Image-Oriented Feature Extraction and Selection Technique

Wei He 0011, Yigang He, Bing Li 0006, Chaolong Zhang. A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using Image-Oriented Feature Extraction and Selection Technique. IEEE Access, 8:5065-5079, 2020. [doi]

Abstract

Abstract is missing.