Kai He, Xin Huang, Sheldon X.-D. Tan. EM-Based On-Chip Aging Sensor for Detection of Recycled ICs. IEEE Design & Test of Computers, 33(5):56-64, 2016. [doi]
@article{HeHT16,
title = {EM-Based On-Chip Aging Sensor for Detection of Recycled ICs},
author = {Kai He and Xin Huang and Sheldon X.-D. Tan},
year = {2016},
doi = {10.1109/MDAT.2016.2582830},
url = {http://dx.doi.org/10.1109/MDAT.2016.2582830},
researchr = {https://researchr.org/publication/HeHT16},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {33},
number = {5},
pages = {56-64},
}