Hybrid BIST Test Scheduling Based on Defect Probabilities

Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles. Hybrid BIST Test Scheduling Based on Defect Probabilities. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 230-235, IEEE Computer Society, 2004. [doi]

@inproceedings{HeJPE04,
  title = {Hybrid BIST Test Scheduling Based on Defect Probabilities},
  author = {Zhiyuan He and Gert Jervan and Zebo Peng and Petru Eles},
  year = {2004},
  url = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350230abs.htm},
  tags = {rule-based, testing},
  researchr = {https://researchr.org/publication/HeJPE04},
  cites = {0},
  citedby = {0},
  pages = {230-235},
  booktitle = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2235-1},
}