Accumulated Cost Based Test-Cost-Sensitive Attribute Reduction

Huaping He, Fan Min. Accumulated Cost Based Test-Cost-Sensitive Attribute Reduction. In Sergei O. Kuznetsov, Dominik Slezak, Daryl H. Hepting, Boris Mirkin, editors, Rough Sets, Fuzzy Sets, Data Mining and Granular Computing - 13th International Conference, RSFDGrC 2011, Moscow, Russia, June 25-27, 2011. Proceedings. Volume 6743 of Lecture Notes in Computer Science, pages 244-247, Springer, 2011. [doi]

@inproceedings{HeM11,
  title = {Accumulated Cost Based Test-Cost-Sensitive Attribute Reduction},
  author = {Huaping He and Fan Min},
  year = {2011},
  doi = {10.1007/978-3-642-21881-1_39},
  url = {http://dx.doi.org/10.1007/978-3-642-21881-1_39},
  tags = {rule-based, testing},
  researchr = {https://researchr.org/publication/HeM11},
  cites = {0},
  citedby = {0},
  pages = {244-247},
  booktitle = {Rough Sets, Fuzzy Sets, Data Mining and Granular Computing - 13th International Conference, RSFDGrC 2011, Moscow, Russia, June 25-27, 2011. Proceedings},
  editor = {Sergei O. Kuznetsov and Dominik Slezak and Daryl H. Hepting and Boris Mirkin},
  volume = {6743},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-21880-4},
}